发明名称 Thin lightshield process for solid-state image sensors
摘要 An image sensor includes a substrate having photosensitive areas; an insulator spanning the substrate; and a first and second layer of a multi-layer metallization structure, wherein the first layer forms light shield regions over selected portions of the photosensitive area as well forming circuit interconnections and barrier regions to prevent spiking into the substrate or gates at contacts in the non-imaging area; and the second layer spanning the interconnections and barrier regions of the first layer only over the non-imaging areas and the second layer overlays edges of the first layer.
申请公布号 US7391001(B2) 申请公布日期 2008.06.24
申请号 US20050068358 申请日期 2005.02.28
申请人 EASTMAN KODAK COMPANY 发明人 NICHOLS DAVID N.;STEVENS ERIC G.;KOSMAN STEPHEN L.
分类号 H01L21/00;H01L21/4763;H01L27/146;H01L31/02 主分类号 H01L21/00
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