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发明名称	handler for testing semiconductors
摘要
申请公布号	KR100840209(B1)	申请公布日期	2008.06.23
申请号	KR20060077202	申请日期	2006.08.16
申请人		发明人
分类号	G01R31/26;H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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