PAD UNIT HAVING TEST LOGIC CIRCUIT AND METHOD OF DRIVING SYSTEM INCLUDING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide a pad unit having a test logic circuit for a chain test having a noise reduction function, and a method of driving a system with the usage of the pad unit having the test logic circuit. SOLUTION: The method comprises a step for performing the chain test using a pad and a logic chain, and a step for disabling the logic chain to prevent noise propagation by the logic chain and driving the system. COPYRIGHT: (C)2008,JPO&INPIT