发明名称 CONDUCTION TESTING PROBE PIN
摘要 PROBLEM TO BE SOLVED: To enable one conduction testing probe pin to be used as one of an extensible pin and a nonflexible pin in response to test applications. SOLUTION: The conduction testing probe pin 10 having a pin body 30 which includes a contact terminal 301 at one end to contact with an object to be tested and is slidably inserted in a barrel 20 on the other end side such that the pin body 30 is biased by a spring means 210 disposed in the barrel in a direction projecting from the barrel 20, is equipped with a pin fixing means (i.e., an engaging groove 321 formed on the pin body 30 side and an engaging projection 410 detachably engaging with the engaging groove 321 from the outside of the barrel 20) which brings the pin body 30 to be in an unslidable state selectively with respect to the barrel 20. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008139089(A) 申请公布日期 2008.06.19
申请号 JP20060323791 申请日期 2006.11.30
申请人 OPTREX CORP 发明人 KAWAMATA NORIHIRO
分类号 G01R1/067 主分类号 G01R1/067
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