发明名称 APPARATUS FOR INSPECTING ELECTRIC CONDITION AND METHOD FOR MANUFACTURING THE SAME
摘要 An electric inspecting apparatus and a manufacturing method thereof are provided to keep flatness of the first surface of a first substrate uniform by sufficiently reducing bending of the first substrate. In an electric inspecting apparatus(100), a first substrate(10) has a first surface(10a) having a probe tip(12) contacting with an object and a second surface(10b) facing the first surface and having pads(14) receiving an electric signal applied by contacting with the object. A second substrate(16) is positioned to face the second surface of the first substrate, to receive the electric signals applied from the pads, respectively. A connecting unit(25) is vertically positioned between the first and second substrates. The section of a part of the connecting unit contacting with each pad is flat. The connecting unit surface-contacts with each pad in connecting the first and second substrates electrically. The connecting unit comprises a first connecting part(21) coupled with the first substrate and a second connecting part(23) coupled with the second substrate. The connecting unit electrically connects the first and second substrates by forcibly fitting the first and second connecting parts.
申请公布号 KR100839798(B1) 申请公布日期 2008.06.19
申请号 KR20070021362 申请日期 2007.03.05
申请人 PHICOM CORP.;LEE, OUG KI 发明人 LEE, OUG KI
分类号 G01R1/067;G01R31/26 主分类号 G01R1/067
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