| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device capable of an exact inspection comparatively in a short time and an exact inspection of a reflector combined with a discharge type light-emitting tube. SOLUTION: The inspection device comprises a holder 71 which fixes an ellipse reflector ER to be inspected, a light-emitting device 67 having an inspection lamp light source 68, a light source displacement device 72 which displaces the light-emitting device 67 relative to the ellipse reflector ER, a mask 61 having an aperture AP, and an integrating sphere 76 and a simple illuminator 77 which are arranged at the back stage of the mask 61 and carry out the measurement of the inspection light TL. The mask 61 has the aperture AP having a size which is predetermined from the size of a filament 68a combined with the lamp light source 68, and is fixed a second focus point F2 of the ellipse reflector ER in fixed state. Therefore, the measurement which is decreased the influence of the shape of the filament 68a of the inspection lamp light source 68 becomes possible. The characteristics of the ellipse reflector ER can be measured accurately comparatively. COPYRIGHT: (C)2008,JPO&INPIT
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