| 摘要 |
<p>Provided is a test device for testing a device under test (DUT). The test device includes: a plurality of signal output units, each outputting a test signal to a terminal of the DUT; a plurality of signal input units, each inputting a signal outputted from the terminal of the DUT in accordance with the test signal; a noise transmission path for noise propagation to at least one signal input unit used for detecting a noise of the test device; a detection control unit which causes at least one signal input unit to operate in a window detection mode for detecting whether a voltage of the input signal inputted from the noise transmission path is out of a reference range set in advance between the test cycles; and a judging unit which decides that a noise is detected between the test cycles in accordance with the detection of the voltage out of the reference range by at least one signal input unit.</p> |
