发明名称 |
Circuit delay analyzer, circuit delay analyzing method, and computer product |
摘要 |
Delay analysis performed on a circuit having multiple parallel partial circuits (paths) involves recursively integrating two paths of the circuit using an all-element delay distribution that indicates delay based on performance of all circuit elements in a path and a correlation delay distribution that indicates delay based on correlation between circuit elements in the path. An all-element delay distribution is calculated for the integrated path using the all-element delay distributions of the two paths to be integrated. The all-element delay distributions and the correlation delay distributions of two paths to be integrated are used to calculate a total delay distribution for the integrated path. The total delay distribution is used with the all-element delay distribution for the integrated path to calculate a correlation delay distribution for the integrated path. Through recursive calculation, a delay distribution of the circuit is estimated.
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申请公布号 |
US2008148205(A1) |
申请公布日期 |
2008.06.19 |
申请号 |
US20070902489 |
申请日期 |
2007.09.21 |
申请人 |
FUJITSU LIMITED |
发明人 |
HOMMA KATSUMI;MATSUOKA HIDETOSHI;NITTA IZUMI;SHIBUYA TOSHIYUKI |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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