发明名称 TREATMENT METHOD OF SEMICONDUCTOR, METHOD FOR MANUFACTURING MOS, AND MOS STRUCTURE
摘要 The method of the present invention includes providing a semiconductor substrate with a recess; performing a pre-cleaning step on the semiconductor substrate; and performing a first reduction step, a lateral etching step and a second reduction step on the semiconductor substrate. The MOS structure includes a semiconductor substrate, a gate structure on the semiconductor substrate, a pair of recesses with beak sections extending to and under the gate structure, and a strain material filling the recess. The recess inside the semiconductor substrate processed by the method including the lateral etching step forms a beak section.
申请公布号 US2008142886(A1) 申请公布日期 2008.06.19
申请号 US20060611891 申请日期 2006.12.18
申请人 LIAO CHIN-I;CHIEN CHIN-CHENG 发明人 LIAO CHIN-I;CHIEN CHIN-CHENG
分类号 H01L27/00;H01L21/302 主分类号 H01L27/00
代理机构 代理人
主权项
地址