发明名称 SHIFT REGISTER, SCANNING LINE DRIVE CIRCUIT, DATA LINE DRIVE CIRCUIT, ELECTRO-OPTICAL DEVICE, AND ELECTRONIC DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To prevent operation errors in a shift register composed of transistors of the same conductivity types. <P>SOLUTION: A gate of the transistor M2 bringing an output signal Y in a low level is connected to a node &beta; of a second gate signal generator 13A. The output signal Y is fed back to a gate of the transistor M4 in the second gate signal generator 13A to make the transistor M4 charge the node &beta; to a low level in a period when the output signal Y is in a high level. On the other hand, in a period when the output signal Y is in a low level, the transistor M3 in the second gate signal generator 13A repeats to charge the node &beta; to a high level at a predetermined clock cycle. Thus, even if an off-leak current of the transistor M4 is large, operation errors caused by the falling potential of the node &beta; can be prevented. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008140489(A) 申请公布日期 2008.06.19
申请号 JP20060326567 申请日期 2006.12.04
申请人 SEIKO EPSON CORP 发明人 YAMAZAKI TAKU
分类号 G11C19/28;G02F1/133;G02F1/1345;G09G3/20;G09G3/36;G11C19/00 主分类号 G11C19/28
代理机构 代理人
主权项
地址