| 摘要 |
PROBLEM TO BE SOLVED: To facilitate an access to each board, even when a large number of boards are fitted in a testing device for semiconductor integrated circuits. SOLUTION: The testing device 100 is equipped with a unit 102 for tests housing a large number of test cards 104. The unit 102 is equipped with a common RS232C external terminal 120, which is connected to an outside controller PC 108 with a serial communication cable 122. Inside the unit 102, the external terminal 120 is connected to each test card 104 via a piece of distributing connecting wire 126. Since only one of the large number of test cards 104 is selected by switching in a switch section 128, on the occasion of connection using the RS232C, processing such as debugging or the like can be easily performed without providing wiring conductors around inside a case. COPYRIGHT: (C)2008,JPO&INPIT
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