发明名称 Method for forming a semiconductor structure
摘要 A method for semiconductor structure formation includes: providing a substrate; forming a first lower mask layer on the substrate; forming a first patterned mask on the first lower mask layer; forming a second lower mask layer on the first lower mask layer and overlaying the first patterned mask; forming a second patterned mask on the second lower mask layer without the second patterned mask overlapping the first patterned mask; etching and undercutting the first lower mask layer and the second lower mask layer to form the third patterned mask with the first patterned mask and the second patterned mask; etching the substrate by using the third patterned mask to form a plurality of islands; and removing the third patterned mask.
申请公布号 US2008146031(A1) 申请公布日期 2008.06.19
申请号 US20070000538 申请日期 2007.12.13
申请人 NANYA TECHNOLOGY CORPORATION 发明人 LIU HUNG JEN;HSIEH WEI HSIEN;YEH CHANG-HO
分类号 H01L21/461 主分类号 H01L21/461
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