发明名称 NOVEL METHOD TO ADJUST WORK FUNCTION BY PLASMA ASSISTED METAL INCORPORATED DIELECTRIC
摘要 The present disclosure provides a method of fabricating a semiconductor device. The method includes forming a gate dielectric on a substrate; introducing metal dopants into the gate dielectric; annealing the gate dielectric; and forming a gate electrode on the gate dielectric.
申请公布号 US2008146012(A1) 申请公布日期 2008.06.19
申请号 US20070695227 申请日期 2007.04.02
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN WENLI;HOU YONG-TIAN;LIN KANG-CHENG;HUANG KUO-TAI;LEE TZE-LIANG;LIANG MONG-SONG
分类号 H01L21/3205;H01L21/31 主分类号 H01L21/3205
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