发明名称 NITRIDE SEMICONDUCTOR DEVICE AND NITRIDE SEMICONDUCTOR MANUFACTURING METHOD
摘要 A nitride semiconductor device includes a first III nitride semiconductor layer and a second III nitride semiconductor layer. The first III nitride semiconductor layer has a V/III ratio, i.e., a ratio of the nitrogen material (molar ratio) to the III element material (more specifically, gallium material), at a prescribed ratio of first V/III, and has a growing main plane other than a c-plane. The second III nitride semiconductor layer is arranged on the first III nitride semiconductor layer, has a second V/III ratio higher than the first V/III ratio, and has the growing main plane same as that of the first III nitride semiconductor layer.
申请公布号 WO2008072601(A1) 申请公布日期 2008.06.19
申请号 WO2007JP73792 申请日期 2007.12.10
申请人 ROHM CO., LTD.;OKAMOTO, KUNIYOSHI;OHTA, HIROAKI 发明人 OKAMOTO, KUNIYOSHI;OHTA, HIROAKI
分类号 H01L21/205;H01L33/06;H01L33/16;H01L33/20;H01L33/32;H01L33/40 主分类号 H01L21/205
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