发明名称 |
SEMICONDUCTOR DEVICE, AND TESTING METHOD AND DEVICE FOR THE SAME |
摘要 |
A semiconductor device includes: a circuit board; a semiconductor chip mounted over the circuit board with a predetermined gap therebetween and electrically connected to the circuit board by a protruding electrode; a first resin material filled into the gap between the circuit board and the semiconductor chip; a second resin material that seals the semiconductor chip mounted over the circuit board; a first reflector which is formed on a surface of the circuit board on the semiconductor chip side and reflects a predetermined testing light; and a second reflector which is formed on a surface of the semiconductor chip on the circuit board side and reflects the predetermined testing light.
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申请公布号 |
US2008144048(A1) |
申请公布日期 |
2008.06.19 |
申请号 |
US20070620909 |
申请日期 |
2007.01.08 |
申请人 |
IKEBE NOBUAKI;IWAFUCHI TOSHIAKI;SATOU MICHIHIRO;YAMAGATA YUJI |
发明人 |
IKEBE NOBUAKI;IWAFUCHI TOSHIAKI;SATOU MICHIHIRO;YAMAGATA YUJI |
分类号 |
G01B11/14;H01L23/58 |
主分类号 |
G01B11/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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