发明名称 SEMICONDUCTOR DEVICE, AND TESTING METHOD AND DEVICE FOR THE SAME
摘要 A semiconductor device includes: a circuit board; a semiconductor chip mounted over the circuit board with a predetermined gap therebetween and electrically connected to the circuit board by a protruding electrode; a first resin material filled into the gap between the circuit board and the semiconductor chip; a second resin material that seals the semiconductor chip mounted over the circuit board; a first reflector which is formed on a surface of the circuit board on the semiconductor chip side and reflects a predetermined testing light; and a second reflector which is formed on a surface of the semiconductor chip on the circuit board side and reflects the predetermined testing light.
申请公布号 US2008144048(A1) 申请公布日期 2008.06.19
申请号 US20070620909 申请日期 2007.01.08
申请人 IKEBE NOBUAKI;IWAFUCHI TOSHIAKI;SATOU MICHIHIRO;YAMAGATA YUJI 发明人 IKEBE NOBUAKI;IWAFUCHI TOSHIAKI;SATOU MICHIHIRO;YAMAGATA YUJI
分类号 G01B11/14;H01L23/58 主分类号 G01B11/14
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