发明名称 |
CALIBRATED S-PARAMETER MEASUREMENTS OF PROBES |
摘要 |
Method and apparatus for calibrating a probe (32) including calibrating a reference plane along a transmission line, the transmission line having a first port and a second port, calculating a reflection from the reference plane into the second port with the second port coupled to a load (25), applying the probe to a physical location along the transmission line substantially corresponding to the reference plane, measuring a probe response between the first port of the transmission line and an output of the probe, and de-embedding calibrated probe parameters using the probe response and the reflection from the reference plane into the second port. |
申请公布号 |
WO2008021907(A3) |
申请公布日期 |
2008.06.19 |
申请号 |
WO2007US75515 |
申请日期 |
2007.08.08 |
申请人 |
TEKTRONIX, INC.;DOUBRAVA, LAUDIE;HAGERUP, WILLIAM |
发明人 |
DOUBRAVA, LAUDIE;HAGERUP, WILLIAM |
分类号 |
G01R35/00;G01R27/28 |
主分类号 |
G01R35/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|