发明名称 CALIBRATED S-PARAMETER MEASUREMENTS OF PROBES
摘要 Method and apparatus for calibrating a probe (32) including calibrating a reference plane along a transmission line, the transmission line having a first port and a second port, calculating a reflection from the reference plane into the second port with the second port coupled to a load (25), applying the probe to a physical location along the transmission line substantially corresponding to the reference plane, measuring a probe response between the first port of the transmission line and an output of the probe, and de-embedding calibrated probe parameters using the probe response and the reflection from the reference plane into the second port.
申请公布号 WO2008021907(A3) 申请公布日期 2008.06.19
申请号 WO2007US75515 申请日期 2007.08.08
申请人 TEKTRONIX, INC.;DOUBRAVA, LAUDIE;HAGERUP, WILLIAM 发明人 DOUBRAVA, LAUDIE;HAGERUP, WILLIAM
分类号 G01R35/00;G01R27/28 主分类号 G01R35/00
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