发明名称 APPARATUS AND METHOD FOR TREATING SUBSTRATE
摘要 An apparatus and a method for treating a substrate are provided to increase the wafer throughput and decrease the foot print by equipping a lot of process chambers more than a conventional method. A substrate treatment apparatus comprises a transfer chamber(40), a plurality of process chambers(50) which is installed around the transfer chamber, a first and a second load lock chambers(32,34) which are installed around the transfer chamber, a load port(10) which settles a storage member for storing the plural substrates, and an EFEM(Equipment Front End Module)(20) which transfers the substrate between the load port and the first load lock chamber, and between the load port and the second load lock chamber. Wherein, the transfer chamber comprises a first and a second transfer chambers which are located adjacent to each other.
申请公布号 KR20080054759(A) 申请公布日期 2008.06.19
申请号 KR20060127283 申请日期 2006.12.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HAG PIL;HAHN, SEOK HYUN
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
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