| 摘要 |
PROBLEM TO BE SOLVED: To provide a debug information collection method which reduces the burden of device side and the burden of software developer side at the same time, and besides which can acquire debug information without bias and uniformly. SOLUTION: At a software distribution apparatus 102, a binary analysis part 122 seeks for a universal set of probe insertion positions which allow probe insertion in software. A binary change part 125 decides a population of insertion positions of probes to be inserted in software and the number of probe insertions every devices 104, and inserts them in software by selecting the probe insertion positions from the population insertion. At that time, the binary change part 125 refers to probe information 123, execution apparatus information 124, and debug information 132. A software distribution part 129 distributes to devices 104 software in which probes are inserted. COPYRIGHT: (C)2008,JPO&INPIT
|
