发明名称 |
IMPEDANCE CALIBRATION CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME |
摘要 |
An impedance calibration circuit and a semiconductor device including the same are provided. An embodiment of the invention provides an impedance calibration circuit with a variable reference voltage generation unit. The impedance calibration circuit maximizes the number of semiconductor devices that can be tested in test equipment at one time and permits the operation of an impedance matching unit (e.g., an on-die-termination (ODT) circuit and/or an off-chip-driver (OCD)) to be tested for a variety of reference resistor values.
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申请公布号 |
US2008143377(A1) |
申请公布日期 |
2008.06.19 |
申请号 |
US20070853956 |
申请日期 |
2007.09.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO YONG-KI;LEE MI-JIN;CHUNG SUNG-JINN |
分类号 |
H03K19/0175 |
主分类号 |
H03K19/0175 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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