发明名称 TRANSFORMING MEASUREMENT DATA FOR CLASSIFICATION LEARNING
摘要 A system (600), apparatus (500), and method is provided for a combined transformation of measurement data so that the transformed data are suitable for input by pattern classification learning methods. Sensitivity of transformed data is reduced in the unreliable region while it is largely unchanged or enhanced everywhere else. A Gaussian transform is combined with a sigmoid function, using a combined transform module (502) in the apparatus (500) and system (600) to achieve the sensitivity reduction. A user can direct the processing via a user control subsystem (604) of the system (600) and by providing user analysis input (508) input to the apparatus (500).
申请公布号 WO2007129233(A3) 申请公布日期 2008.06.19
申请号 WO2007IB51283 申请日期 2007.04.10
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;SCHAFFER, DAVID 发明人 SCHAFFER, DAVID
分类号 G06N3/04;G06N3/00;G06N3/02;G06N3/08 主分类号 G06N3/04
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