发明名称 SEMICONDUCTOR PHOTODETECTOR COATING, ITS MANUFACTURING METHOD, AND SEMICONDUCTOR PHOTODETECTOR
摘要 <P>PROBLEM TO BE SOLVED: To provide an inexpensive semiconductor photodetector coating in which balance of miniaturization/thinning and optical performance/adhesion is sufficient, which is superior in optical performance, securely has heat resistance of 350&deg;C or above and has short coating time. <P>SOLUTION: The semiconductor photodetector coating is formed on a surface of a semiconductor photodetector. A SiO<SB>2</SB>layer as a low refractive index layer or a TiO<SB>2</SB>layer as a high refractive index layer is set to be a first layer, and both layers are alternately laminated so that 47 layers or 49 layers can be obtained in total. The semiconductor photodetector coating has thickness of 5 to 7 &mu;m. The semiconductor photodetector has the semiconductor photodetector coating for either layer. Pressure of oxygen in atmosphere at the time of vacuum deposition of the TiO<SB>2</SB>layer is 2.6&times;10<SP>-2</SP>to 3.2&times;10<SP>-2</SP>Pa in either layer. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008141028(A) 申请公布日期 2008.06.19
申请号 JP20060326510 申请日期 2006.12.04
申请人 SEI HYBRID KK 发明人 KINOSHITA SHIGENORI;NAKAYAMA SHIGERU
分类号 H01L31/10;H01L31/02 主分类号 H01L31/10
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