| 摘要 |
<p>Provided is a testing apparatus for testing a device which is to be tested and has a plurality of power supply pins to be short-circuited in the device. The testing apparatus is provided with a power supply section which generates a power supply voltage to be supplied to the device to be tested and supplies at least one power supply pin of the device with the voltage; and a power supply monitor for detecting a voltage at a power supply pin to which the power supply section does not supply the power supply voltage, among the power supply pins of the device. The testing apparatus may be further provided with a connecting section, which has a plurality of power supply input terminals that correspond to the power supply pins one by one and electrically connect the corresponding power supply input terminal with the power supply pin. The power supply section may supply the power supply pin with the power supply voltage through a power supply input terminal, and the power supply monitor may detect a voltage at the power supply pin through the power supply input terminal.</p> |
