| 摘要 |
A testing apparatus for testing devices to be tested is provided with a plurality of drivers for outputting test signals in different timings, and a connecting section, which connects each wiring for transmitting the test signal outputted from each driver, connects the wiring to an input terminal of the device to be tested, superimposes test signals and inputs them to an input terminal. The connecting section has a performance board for placing the device to be tested, and each wiring may be connected on the performance board.
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