发明名称 INSULATING-GATE FET AND ITS MANUFACTURING METHOD
摘要 <p>Provided is an IGFET capable of turning off when voltage of an inverse direction is applied. The IGFET includes an N<SUP>+</SUP> first drain region (6), an N<SUP>-</SUP> second drain region (7), a P first body region (8), a P<SUP>-</SUP> second body region (9), an N first source region (10a), and an N<SUP>+</SUP> second source region (10b). A gate insulating film (5) and a gate electrode (4) are arranged in a trench (11) formed on a semiconductor substrate (1). The source electrode (3) is in ohmic contact with the N first source region (10a) and the N<SUP>+</SUP> second source region (10b) and in shot key barrier contact with the P<SUP>-</SUP> second body region (9).</p>
申请公布号 WO2008069145(A1) 申请公布日期 2008.06.12
申请号 WO2007JP73232 申请日期 2007.11.30
申请人 SANKEN ELECTRIC CO., LTD.;TAKAHASHI, RYOJI 发明人 TAKAHASHI, RYOJI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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