发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY DEVICES
摘要 A non-volatile memory device includes a tunneling insulating layer on a semiconductor substrate, a charge storage layer, a blocking insulating layer, and a gate electrode. The charge storage layer is on the tunnel insulating layer and has a smaller band gap than the tunnel insulating layer and has a greater band gap than the semiconductor substrate. The blocking insulating layer is on the charge storage layer and has a greater band gap than the charge storage layer and has a smaller band gap than the tunnel insulating layer. The gate electrode is on the blocking insulating layer.
申请公布号 US2008135923(A1) 申请公布日期 2008.06.12
申请号 US20080031096 申请日期 2008.02.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE CHANG-HYUN;CHOI JUNG-DAL;YE BYOUNG-WOO
分类号 H01L27/115;H01L21/28;H01L21/336;H01L21/8247;H01L29/423;H01L29/51;H01L29/792 主分类号 H01L27/115
代理机构 代理人
主权项
地址
您可能感兴趣的专利