| 摘要 |
<p>A method of waterproof testing an electronic device at a rated water depth is provided. The method may comprise the steps of assembling the electronic device; subjecting the electronic device to a test vacuum pressure associated with the rated water depth; measuring a leak rate of the electronic device after the electronic device is subjected to the test vacuum pressure; rejecting the electronic device if the leak rate is above an allowable leak rate; and accepting the electronic device if the leak rate is below the allowable leak rate.</p> |
