Halbleitertestgerät und Verfahren zum Testen einer Halbleitervorrichtung,申请号DE20001028835-传众专利搜索

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发明名称	Halbleitertestgerät und Verfahren zum Testen einer Halbleitervorrichtung
摘要
申请公布号	DE10028835(B4)	申请公布日期	2008.06.12
申请号	DE20001028835	申请日期	2000.06.09
申请人	ADVANTEST CORP.	发明人	FURUKAWA, YASUO
分类号	G01R31/26;G01R31/3167;G01R1/07;G01R31/316;G01R31/3193;H03M1/10	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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