发明名称 Gated Diode Nonvolatile Memory Process
摘要 A gated diode nonvolatile memory cell with a charge storage structure includes a diode structure with an additional gate terminal. Example embodiments include the individual memory cell, an array of such memory cells, methods of operating the memory cell or array of memory cells, and methods of manufacturing the same.
申请公布号 US2008135920(A1) 申请公布日期 2008.06.12
申请号 US20070923069 申请日期 2007.10.24
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LIAO YI YING;TSAI WEN JER;YEH CHIH CHIEH
分类号 H01L29/792 主分类号 H01L29/792
代理机构 代理人
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