发明名称 METHOD FOR IMPROVING SURFACE
摘要 PROBLEM TO BE SOLVED: To provide a method for improving the surface of a semiconductor substrate which is at least partially made of silicon and capable of completely repairing defects present in or on the semiconductor substrate so as to obtain a semiconductor substrate having high surface quality. SOLUTION: A method of the type described above includes a deposition step including selective epitaxial deposition in at least one hole formed on the surface of the semiconductor substrate. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008135720(A) 申请公布日期 2008.06.12
申请号 JP20070271616 申请日期 2007.10.18
申请人 SOITEC SILICON ON INSULATOR TECHNOLOGIES 发明人 LIN WEN
分类号 H01L21/02;H01L27/12 主分类号 H01L21/02
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