摘要 |
PROBLEM TO BE SOLVED: To measure the yield stress of a spherical particle with a dimension of several tenμm or below with higher precision. SOLUTION: The spherical particle B being a measuring target is arranged and held between a lower compression part 102 and an upper compression part 103, a load applying part 107 is operated to displace the upper compression part 103 in the direction of a stage 101 and the spherical particle B is crushed. At this time, the operation of the load applying part 107 is controlled by a load control part 108 so that the load measured by a load detection part 106 reaches a set value (load F). Next, the displacement quantity of the upper compression part 103 is measured by a displacement measuring part 105 and this measured value is set to the height (h) of the particle after deformation. By this constitution, the effective yield stressσ<SB>y</SB>of the spherical particle being the measuring target is calculated using the obtained particle size D, the load F and the height (h) of the particle and the calculated effective yield stressσ<SB>y</SB>is set to the hardness of the spherical particle. COPYRIGHT: (C)2008,JPO&INPIT
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