发明名称 DETERIORATION TEST METHOD AND DETERIORATION TEST SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a deterioration test method and a deterioration test system capable of conducting a deterioration test in a shorter time and with high accuracy by performing position management of a laser focal point. SOLUTION: This method comprises: a process for emitting laser beam and focusing it on a light shielding film of a liquid crystal panel 15; a process for emitting the laser beam to accelerate deterioration to the area to be tested in the liquid crystal panel 15; a process for positioning the liquid crystal panel 15 at the focal position by setting, as a reference position, the position in which the light-shielding film of the liquid crystal panel 15 is focused on and by determining the focal position of the laser beam based on a correlation between an amount of movement in an optical axis direction of the liquid crystal panel 15 from the reference position on an optical axis 18 of the laser beam and information on deterioration of the liquid crystal panel 15 with respect to the amount of movement; and a process for evaluating light resistance by emitting the laser beam to the liquid crystal panel 15. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008134084(A) 申请公布日期 2008.06.12
申请号 JP20060318705 申请日期 2006.11.27
申请人 SEIKO EPSON CORP 发明人 IMAMURA MITSUHARU
分类号 G01N17/00;G02F1/13 主分类号 G01N17/00
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