发明名称 Structure and method of making interconnect element having metal traces embedded in surface of dielectric
摘要 An interconnect element is provided which includes a dielectric element having a major surface. Metal interconnect patterns are embedded in recesses which extend inwardly from the major surface, the outer surfaces of the interconnect patterns being substantially co-planar with the major surface and extending in one or more directions of the major surface. A projecting conductive film extends over the major surface in at least one direction parallel to a plane defined by the major surface such that it contacts the dielectric element along at least a portion of the major surface and conductively contacts an outer surface of at least one of the metal interconnect patterns.
申请公布号 US2008136041(A1) 申请公布日期 2008.06.12
申请号 US20070805300 申请日期 2007.05.23
申请人 发明人 KOTAKE HIDEKI;HYODO KIYOSHI;KUROSAWA INETARO;HASHIMOTO YUKIO;YOSHINO TOKU;IIJIMA TOMOO
分类号 H01L23/48;H01L21/4763 主分类号 H01L23/48
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