发明名称 Method and system for device characterization with array and decoder
摘要 A system and method for testing devices. The system includes a plurality of pads and a decoder coupled to a plurality of devices. The decoder is configured to receive a plurality of selection signals from the plurality of pads and select a device from the plurality of devices based on at least information associated with the plurality of selection signals. Additionally, the system includes one or more pads connected to the selected device. At least one of the one or more pads is not connected to any of the plurality of devices other than the selected device. The one or more pads are used for testing the selected device.
申请公布号 US2008136437(A1) 申请公布日期 2008.06.12
申请号 US20080018699 申请日期 2008.01.23
申请人 SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 BIN GONG
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址