发明名称 PLASMA PROCESSING APPARATUS AND GAS THROUGH PLATE
摘要 A plasma processing apparatus generates plasma of a processing gas in a processing chamber and performs plasma processing on a substrate. The plasma processing apparatus is provided with a gas through plate between a plasma generating region which corresponds to the substrate on the susceptor and an external region of such region. The through hole forming region is provided with a first region which corresponds to a center portion of the substrate; a second region arranged on an outer circumference of the first region; and a third region which is arranged on an outer circumference of the second region and includes an external region of the substrate. The diameter of a through hole in the first region is the smallest, and that of a through hole in the third region is the largest.
申请公布号 US2008134974(A1) 申请公布日期 2008.06.12
申请号 US20080025428 申请日期 2008.02.04
申请人 TOKYO ELECTRON LIMITED 发明人 TAKAHASHI TETSURO;MAEKAWA KOJI
分类号 C23C16/00 主分类号 C23C16/00
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