| 摘要 |
<p>[PROBLEMS] To provide electronic component testing equipment in which the index time can be shortened. [MEANS FOR SOLVING PROBLEMS] The electronic component testing equipment (1) comprises a test chamber (120) for performing test of an IC device. The test chamber (120) includes a horizontal conveying device (121) having an abutting member (122b) abutting against a test tray (TST) mounting the IC device and conveying the test tray (TST) in a predetermined direction by moving the abutting member (122b), and a Z axis driver (129) for pushing the test tray (TST) and the IC device toward the test head (5) side. When the test tray (TST) and the IC device are pushed, a movable space (S<SUB>0</SUB>) of the abutting member (122b) is formed.</p> |
