发明名称 SOLID-STATE IMAGER AND FORMATION METHOD USING ANTI-REFLECTIVE FILM FOR OPTICAL CROSSTALK REDUCTION
摘要 Conductive lines in an imaging device are coated with an anti-reflective film to reduce crosstalk caused by light reflecting from the conductive lines. An interface results between the anti-reflective film and the surface of the conductive line surface. A second interface exists between the anti-reflective film and an overlying insulating layer. The anti-reflective film is formed from a material having a complex refractive index such that reflectance is reduced at each of the two interfaces. The anti-reflective film also can be light absorbing to provide further reductions in light reflection and consequent crosstalk.
申请公布号 EP1929771(A2) 申请公布日期 2008.06.11
申请号 EP20060824848 申请日期 2006.08.24
申请人 MICRON TECHNOLOGY, INC. 发明人 LI, JIUTAO
分类号 H04N5/335 主分类号 H04N5/335
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