发明名称 Extended drain metal oxide semiconductor transistor and manufacturing method thereof
摘要 A MOS transistor having an extended drain structure and including a semiconductor substrate formed in a well of a first conductivity type. A gate insulating layer is formed on the substrate, a gate electrode is formed on the gate insulating layer, and a source region is formed in a first portion of the substrate, which is near to one side of the gate insulating layer and the gate electrode. A drain region is formed in a second portion of the substrate, which is near to another side of the gate insulating layer and the gate electrode. The second portion is recessed from the surface of the substrate by a predetermined depth.
申请公布号 US7385261(B2) 申请公布日期 2008.06.10
申请号 US20050320615 申请日期 2005.12.30
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 LEE SANG BUM
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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