发明名称 |
FINFET AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A FinFET and a method of manufacturing the same are provided to prevent effectively threshold voltage drop generated in a device which has an oxide layer having the same thickness at the upper part and a side part of a fin, and to prevent the deterioration of an electrical property. A semiconductor fin(210) is formed, including an upper part plane and a side plane which have different crystal planes respectively. A first gate insulating layer(250a) is formed at the side plane of the semiconductor fin, and a second insulating layer(250b) which is thicker than the first gate insulating layer is formed at the upper part plane. A gate electrode is formed on the first and second gate insulating layers.
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申请公布号 |
KR100836761(B1) |
申请公布日期 |
2008.06.10 |
申请号 |
KR20060124950 |
申请日期 |
2006.12.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, DEOK HYUNG;LEE, SUN GHIL;YOO, JONG RYEOL;CHOI, SI YOUNG |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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