发明名称 FINFET AND METHOD OF MANUFACTURING THE SAME
摘要 A FinFET and a method of manufacturing the same are provided to prevent effectively threshold voltage drop generated in a device which has an oxide layer having the same thickness at the upper part and a side part of a fin, and to prevent the deterioration of an electrical property. A semiconductor fin(210) is formed, including an upper part plane and a side plane which have different crystal planes respectively. A first gate insulating layer(250a) is formed at the side plane of the semiconductor fin, and a second insulating layer(250b) which is thicker than the first gate insulating layer is formed at the upper part plane. A gate electrode is formed on the first and second gate insulating layers.
申请公布号 KR100836761(B1) 申请公布日期 2008.06.10
申请号 KR20060124950 申请日期 2006.12.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, DEOK HYUNG;LEE, SUN GHIL;YOO, JONG RYEOL;CHOI, SI YOUNG
分类号 H01L21/336 主分类号 H01L21/336
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