发明名称 Divergent charged particle implantation for improved transistor symmetry
摘要 The present invention provides a method for implanting charged particles in a substrate and a method for manufacturing an integrated circuit. The method for implanting charged particles in a substrate, among other steps, includes projecting a beam of charged particles ( 320 ) to a substrate ( 330 ), the beam of charged particles ( 320 ) having a given beam divergence, and forming a diverged beam of charged particles ( 360 ) by subjecting the beam of charged particles ( 320 ) to an energy field ( 350 ), thereby causing the beam of charged particles ( 320 ) to have a larger beam divergence. The method then desires implanting the diverged beam of charged particles ( 360 ) into the substrate ( 330 ).
申请公布号 US7385202(B2) 申请公布日期 2008.06.10
申请号 US20040006185 申请日期 2004.12.07
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 BERNSTEIN JAMES D.;ROBERTSON LANCE S.;GHNEIM SAID;XU JIEJIE;LOEWECKE JEFFREY
分类号 G01N23/00;G21K7/00 主分类号 G01N23/00
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