发明名称 ION BEAM SOURCE, AND FILM DEPOSITION SYSTEM PROVIDED THEREWITH
摘要 <P>PROBLEM TO BE SOLVED: To provide an in beam source for preventing abnormal discharge generated in the vicinity of each cathode and suppressing the generation of particles and splashes, and to provide a film deposition system provided therewith. <P>SOLUTION: The ion beam source comprises a metallic enclosure provided with cathodes, magnetic gaps, a magnetic field generating means for generating a magnetic field in the enclosure, reactive gas introducing means for introducing reactive gas into the enclosure, and anodes each arranged in the vicinity of the magnetic gap; wherein an insulating coating film is formed on the surface of each cathode in such a manner that the film thickness is controlled to 100 to 200 &mu;m. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008127611(A) 申请公布日期 2008.06.05
申请号 JP20060312249 申请日期 2006.11.17
申请人 ULVAC JAPAN LTD 发明人 NAKAMUTA TAKESHI;MATSUMOTO MASAHIRO;SUZUKI TOSHIHIRO;IBORI ATSUHITO;TANI NORIAKI;KUBO MASASHI;MATSUMOTO TAKAFUMI;HANZAWA KOICHI
分类号 C23C14/48;H01J27/02;H01J37/08;H01J37/32;H05H1/24 主分类号 C23C14/48
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