| 摘要 |
The test apparatus includes: a plurality of test modules that transmit/receive signals to/from the plurality of DUTs; a test head on which the plurality of test modules are placed; a plurality of device interface sections each of which is disposed between the test head and the plurality of test modules, includes a wiring that connects between a connector of the test head connected to the corresponding device under test and the test module and an identification information output section that outputs identification information indicative of the type of the device interface section, and is being capable of exchanging in accordance with the corresponding DUT and test module; and a control device connected to the plurality of test modules that controls the test module. Each test module includes: a reading section that reads the identification information; and a command processing section that returns the identification information to the control device.
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