发明名称 Automatic testing method to be used by an IC testing system equipped with multiple testing sites
摘要 An automatic testing method to be used by an IC testing system equipped with multiple testing sites. In this method the testing procedural information for each IC is stored in different sets of image files that are to be read by the testing system. Thus by inputting into the testing system the identification codes of the IC's that are going to be tested, the testing system would recognize which image files to use and the testing procedure would continue automatically. This method would greatly reduce the complex procedures needed to prepare an IC for testing in the prior art, thus leaving less room for human error and increasing the accuracy of the testing procedure.
申请公布号 US2008133166(A1) 申请公布日期 2008.06.05
申请号 US20070798666 申请日期 2007.05.16
申请人 CHROMA ATE INC. 发明人 LAI ANGUS
分类号 G01R31/317;G06K7/10 主分类号 G01R31/317
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