发明名称 Method For Producing Epitaxial Silicon Wafer
摘要 An oxide film 13 on the surface of the substrate 11 and an inner wall oxide film 112 in a COP 111 exposed to the surface of the substrate 11 are removed by cleaning the surface of the substrate 11 with a hydrofluoric acid solution. The substrate 11 is then cleaned with ozone water, thereby forming an oxide film 13 on the surface of the substrate 11 . Thereafter the substrate 11 is subjected to a heat treatment for removing the oxide film 13 on the surface of the substrate 11 . Consequently, the COP 111 on the surface of the substrate 11 is planarized to be eliminated from the substrate surface. Thereafter an epitaxial layer 12 is formed on the surface of the substrate 11.
申请公布号 US2008131605(A1) 申请公布日期 2008.06.05
申请号 US20050793155 申请日期 2005.12.20
申请人 SUMCO TECHXIV CORPORATION 发明人 NASU YUICHI;NARAHARA KAZUHIRO
分类号 H01L21/205;H01L21/324 主分类号 H01L21/205
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