发明名称 |
FILM FORMATION METHOD, FILM FORMING EQUIPMENT, AND PATTERN FORMATION METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a film formation method which can prevent peeling from a substrate of a surface film including a resist film when in liquid immersion exposure. <P>SOLUTION: The film formation method includes a process to form the surface film composed of a resist film 102 and a protective film 103 etc. covering the resist film 102 in the surface of a wafer W, and a process to form an edge cap film 104 by supplying a forming material of the edge cap film in the boundary portion of at least the periphery portion of the wafer W and the periphery portion of the surface film of the protective film 103 etc. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008130789(A) |
申请公布日期 |
2008.06.05 |
申请号 |
JP20060313891 |
申请日期 |
2006.11.21 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
KOSUGI HITOSHI;YAMAMOTO TARO;YAMADA YOSHIAKI;SAIGA YASUHITO |
分类号 |
H01L21/027;G03F7/11;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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