发明名称 HIGH SELECTIVITY BAND-PASS INTERFEROMETER WITH TUNING CAPABILITIES
摘要 <p>A tunable optical band-pass device (101) for spectrally filtering an input light beam is provided. The device includes an interferometer having two inner reflective planar surfaces (203, 204) that face each other and are tilted at an angle a respect to each other, and a translation device (301) for adjusting a relative spacing of the two reflective surfaces, thus tuning the device to any arbitrary wavelength within a broad tuning range. The device also includes an input port for inputting the input light beam in the interferometer and having the input light beam impinge on one of the reflective surfaces at an incidence angle T with respect thereto which is substantially larger than the tilt angle a, and be partially reflected and partially transmitted by this surface thereby producing multiple transmitted light beams. An optical element (213) for collecting the multiple transmitted light beams and producing a spectrally-filtered output light beam is also included.</p>
申请公布号 WO2008064470(A1) 申请公布日期 2008.06.05
申请号 WO2007CA02135 申请日期 2007.11.27
申请人 ROCTEST LTEE;MIRON, NICOLAE 发明人 MIRON, NICOLAE
分类号 G02B6/293 主分类号 G02B6/293
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