发明名称 Apparatus and Process for Producing Thin Films and Devices
摘要 A silicon nitride thin film formation apparatus is provided for stationary and moving substrates and a process for forming such films. The process provides high uniformity of film thickness and film properties as well as a high deposition rate. The film properties are adequate for application as an antireflection layer or passivation layer in solar cell devices or as dielectric layer in thin film transistors. The apparatus includes a number of metal filaments. In the space within the formation apparatus opposite to the substrate with respect to the filaments, a gas dosage system is arranged at a predetermined distance of the filaments. The film formation apparatus for stationary substrates also contains a shutter to control the starting and ending conditions for film formation and to control the film thickness.
申请公布号 US2008128871(A1) 申请公布日期 2008.06.05
申请号 US20050592364 申请日期 2005.03.03
申请人 SCHROPP RUDOLF EMMANUEL ISIDOR;VAN DER WERF CATHARINA HENRIET;STANNOWSKI BERND 发明人 SCHROPP RUDOLF EMMANUEL ISIDORE;VAN DER WERF CATHARINA HENRIETTE MARIA;STANNOWSKI BERND
分类号 H01L23/58;B32B9/04;C23C16/34;C23C16/44;C23C16/54;H01L21/31;H01L21/318 主分类号 H01L23/58
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