发明名称 MICROPATTERN OBSERVATION DEVICE AND MICROPATTERN CORRECTION DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a micropattern correction device capable of providing an observed image, without irregularities. SOLUTION: In this micropattern correction device, a glass surface plate 9 is divided into two sub-glass surface plates 10 and 11 movably disposed horizontally. When a lifter pin hole 22 of the sub glass surface plate 11 exists under an observation position P, the sub-glass surface plate 11 is moved to separate the lifter pin hole 22 from the observation position P. Thus, irregularities of the observation image, resulting from the lifter pin hole 22, can be eliminated. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008128891(A) 申请公布日期 2008.06.05
申请号 JP20060315700 申请日期 2006.11.22
申请人 NTN CORP 发明人 YAMANAKA AKIHIRO
分类号 G01N21/956;G02B5/20;G02F1/13;G09F9/00 主分类号 G01N21/956
代理机构 代理人
主权项
地址