发明名称 SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device that cannot be damaged easily, and to provide a manufacturing method of the semiconductor device. SOLUTION: The semiconductor device 10 comprises: a first semiconductor region 14; a second semiconductor region 16; a third semiconductor region 32; a fourth semiconductor region 34; a trench gate 36; and an internal insulator region 30. The internal insulator region 30 is arranged between a first low-concentration region 20 and a second low-concentration region 22 in the second semiconductor region 16. The entire internal insulator region 30 is arranged at a position deeper than a bottom surface 37 of the trench gate 36. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008130843(A) 申请公布日期 2008.06.05
申请号 JP20060314660 申请日期 2006.11.21
申请人 TOYOTA CENTRAL R&D LABS INC;TOYOTA MOTOR CORP 发明人 ISHIKO MASAYASU;KAWAJI SACHIKO;SAITO JUN
分类号 H01L21/336;H01L29/739;H01L29/78 主分类号 H01L21/336
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