发明名称 |
SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device that cannot be damaged easily, and to provide a manufacturing method of the semiconductor device. SOLUTION: The semiconductor device 10 comprises: a first semiconductor region 14; a second semiconductor region 16; a third semiconductor region 32; a fourth semiconductor region 34; a trench gate 36; and an internal insulator region 30. The internal insulator region 30 is arranged between a first low-concentration region 20 and a second low-concentration region 22 in the second semiconductor region 16. The entire internal insulator region 30 is arranged at a position deeper than a bottom surface 37 of the trench gate 36. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008130843(A) |
申请公布日期 |
2008.06.05 |
申请号 |
JP20060314660 |
申请日期 |
2006.11.21 |
申请人 |
TOYOTA CENTRAL R&D LABS INC;TOYOTA MOTOR CORP |
发明人 |
ISHIKO MASAYASU;KAWAJI SACHIKO;SAITO JUN |
分类号 |
H01L21/336;H01L29/739;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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