发明名称 Illumination lens for an EUV projection microlithography, projection exposure apparatus and method for manufacturing microstructured component
摘要 <p>The optics (6) has a facet mirror (10) including a set of facets configured to generate a defined illumination setting in an illumination field, where each facet is allocated to a partial beam of radiation. The facet mirror includes sub-units, which are made of facet groups. A changing device (44) interchanges one of the sub-units of the facet mirror against an interchangeable sub-unit. A pupil facet mirror (13) is located in a vicinity of secondary light sources generated by the facet mirror, where the pupil facet mirror images the facet mirror in a reticle plane. Independent claims are also included for the following: (1) a method for production of a micro-structured component (2) a micro-structured component.</p>
申请公布号 EP1927892(A1) 申请公布日期 2008.06.04
申请号 EP20070020745 申请日期 2007.10.24
申请人 CARL ZEISS SMT AG 发明人 WARM, BERNDT;DENGEL, GUENTHER
分类号 G03F7/20;B81C99/00 主分类号 G03F7/20
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