发明名称 CMP conditioner
摘要 <p>To provide a CMP conditioner that prevents dissolution of metals in slurry, without the chipping of the abrasive grains and/or decreasing the cutting performance. [Issues to be solved by the invention] The CMP apparatus has a polishing pad that faces and contacts conditioning surface 2 of the conditioner body 1. On this conditioning surface 2, abrasive grains 3 are distributed and fixed to form abrasive grain layer 5, thus forming the CMP conditioner. The conditioner body 1 is made of ceramics, the abrasive grains 3 in the abrasive grain layer 5 are held by binding phase 4 made of low temperature co-fired ceramics.</p>
申请公布号 EP1927434(A1) 申请公布日期 2008.06.04
申请号 EP20070023031 申请日期 2007.11.28
申请人 MITSUBISHI MATERIALS CORPORATION 发明人 RIKITA, NAOKI;CHIDA, KASUMI
分类号 B24B37/04;B24B53/02;B24B53/12;H01L21/304 主分类号 B24B37/04
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